发明名称 WAFER WET CLEANING APPARATUS
摘要 PURPOSE: A wet cleaning apparatus for a wafer is provided to remove foreign materials or stain from the wafer effectively by generating fine bubbles in a cleaning liquid filled in a cleaning bath. CONSTITUTION: A bubbling unit(200) is provided under a substrate mount(130) and generates minute bubbles inside a cleaning bath to remove foreign materials and stain from a wafer. The bubbling unit comprises a bubbling portion(210) and a nitrogen supply portion. The bubbling portion comprises a first supply pipe which is connected to the inner bottom of the cleaning bath to feed nitrogen, and a second supply pipe with fine through holes to inject the nitrogen into the cleaning liquid in the cleaning bath. The nitrogen supply portion supplies nitrogen to the bubbling unit.
申请公布号 KR20100005758(A) 申请公布日期 2010.01.18
申请号 KR20080065790 申请日期 2008.07.08
申请人 DONGBU HITEK CO., LTD. 发明人 LEE, CHEA GAB
分类号 H01L21/304 主分类号 H01L21/304
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