Semiconductor tester and testing method of semiconductor memory

摘要

The disclosure concerns a semiconductor tester for testing a memory under test. The semiconductor tester comprises a pattern generator generating address information on the pages and generating a test pattern; a waveform shaper shaping the test pattern and outputting a test signal based on the shaped test pattern to the memory cells in the page identified by the address information; a comparator comparing a result signal output from the memory under test receiving the test signal with an expectation value; and a bad block memory storing information on a bad block in the memory under test in advance, when the page identified by the address information is included in the bad block, the bad block memory outputting a bad signal used to skip from the address information on the page included in the bad block to the address information on the page included in a next block under test.