发明名称 |
METHOD OF CREATING MASK PATTERN DATA AND METHOD FOR MANUFACTURING MASK |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of creating a mask pattern facilitating formation of a fine pattern with high accuracy in a lithographic process using a reflective optical system. <P>SOLUTION: The method of creating the mask pattern for a device pattern to be formed in a mask 1 for reflective exposure includes a step of generating the data of a mask pattern 6 based on a position correction amount table for correcting a misalignment amount of a transfer position upon transferring the mask pattern 6 onto an exposure object 7 caused associating with at least either a pattern dimension or a pattern pitch of the mask pattern 6. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010008921(A) |
申请公布日期 |
2010.01.14 |
申请号 |
JP20080170963 |
申请日期 |
2008.06.30 |
申请人 |
TOSHIBA CORP |
发明人 |
WATANABE YUMI;SUZUKI MASARU;SATO TAKASHI |
分类号 |
G03F1/24;G03F1/36;G03F1/42;G03F1/44;G03F1/68;G03F1/70;H01L21/027 |
主分类号 |
G03F1/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|