发明名称 Multilayer Structure Measuring Method and Multilayer Structure Measuring Apparatus
摘要 A tomographic image measuring method according to the present invention includes a first step of calculating information corresponding to an optical distance of each layer thickness from a wave-number spectrum, a second step of separating and extracting information of each layer from the information corresponding to the optical distance of each layer thickness, a third step of reconverting information of each layer into a wave-number spectrum, respectively, a fourth step of obtaining a interference wave number from the result of the-third step, a fifth step of calculating an order of interference from the interference wave number and the optical distance of each layer; and a sixth step of calculating the optical distance of each layer by making use of the fact that the order of interference is an integer. Thus, when discrete Fourier transform is used, the measuring precision of layers is improved.
申请公布号 US2010007894(A1) 申请公布日期 2010.01.14
申请号 US20090487026 申请日期 2009.06.18
申请人 CANON KABUSHIKI KAISHA 发明人 SUEHIRA NOBUHITO
分类号 G01B11/02 主分类号 G01B11/02
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