发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device applicable, for example, to a NAND flash memory that can stabilize voltage in a peripheral circuit by reducing leakage current while a high voltage transistor is off. <P>SOLUTION: In a peripheral circuit area PR, a semiconductor layer 14 of SiC or GaN having a wider bandgap than silicon is formed on a part of a silicon substrate 11. Memory cells 13 are formed in the silicon substrate 11. The transistor 15 constituting the peripheral circuit is formed in the semiconductor layer 14. The bandgap of the semiconductor layer 14 is wider than that of silicon, so that no tunnel electrons are developed while the transistor 15 is in an off-state, thereby preventing the occurrence of GIDL. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010010226(A) 申请公布日期 2010.01.14
申请号 JP20080164944 申请日期 2008.06.24
申请人 TOSHIBA CORP 发明人 LIU YING SHEN;MIZUKAMI MAKOTO
分类号 H01L21/8247;H01L21/8234;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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