发明名称 SEMICONDUCTOR DEVICE AND ITS PRODUCTION PROCESS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device and its production process, in which increase in chip size and increase in production cost can be suppressed, regarding semiconductor device including a capacitor such as a memory capacitor and a smoothing capacitor having a large capacity. <P>SOLUTION: The semiconductor device includes: a memory capacitor formed in an upper portion over a semiconductor substrate 1 and comprising a first lower electrode 12A, a first capacitance insulating film 13A and a first upper electrode 14A; a logic circuit transistor 4 formed on a logic circuit region in the semiconductor substrate; and a smoothing capacitor formed in an upper portion over the logic circuit transistor 4 and comprising a second lower electrode 12B, a second capacitance insulating film 13B and a second upper electrode 14B. The second capacitance insulating film 13B is composed of a material having the same composition of that of the first capacitance insulating film 13A and has a film thickness larger than that of the first capacitance insulating film 13A. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010010455(A) 申请公布日期 2010.01.14
申请号 JP20080168734 申请日期 2008.06.27
申请人 PANASONIC CORP 发明人 TATSUNARI TOSHITAKA;KAMATA AKIHIRO
分类号 H01L27/10;H01L21/31;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/105;H01L27/108 主分类号 H01L27/10
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