发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce stress in a substrate, and to provide a method of manufacturing the same. SOLUTION: The semiconductor device includes: a substrate having an element region where a semiconductor element is formed; a via hole formed in a portion of the substrate adjacent to the element region; a conducting portion provided in the via hole via an insulating layer; and a buffer layer provided between the substrate and the insulating layer, wherein the buffer layer is made of a material in which a difference in thermal expansion coefficient between the substrate and the buffer layer is smaller than that between the substrate and the insulating layer. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010010324(A) 申请公布日期 2010.01.14
申请号 JP20080166876 申请日期 2008.06.26
申请人 TOSHIBA CORP 发明人 INOHARA MASAHIRO
分类号 H01L21/3205;H01L21/312;H01L21/314;H01L21/318;H01L23/52 主分类号 H01L21/3205
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