| 摘要 |
A shape measuring device includes: a slit pattern projection unit (1) for projecting a slit light onto a test object (20); an imaging lens (3) and a plane parallel plate (4) for forming a plurality of slit images, which is generated when the slit light is reflected by the object (20), separated in a direction perpendicular to a slit base line direction; an imaging unit (5) for picking up the plurality of slit images and generating a plurality of slit picture images; an XYZ stage drive unit (12) for relatively moving the slit light and the test object (20) in a direction different from the slit base line direction of the slit light; a slit picture image selection unit (8) for comparing the brightness of each pixel of slit picture image on the slit base line direction, and selecting a slit picture image having an optimum brightness to determine the shape of the test object (20) on the slit base line direction, and acquiring image data to determine the shape of the test object (20); and a shape computing unit (9) for computing a shape of the test object (20) using a relative position of the slit light with respect to the test object (20) and the slit picture image data.
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