发明名称 SPIN COATING METHOD, METHOD OF PRODUCING SOLID IMAGING ELEMENT, AND METHOD OF PRODUCING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To enhance the uniformity of the film thickness in the plane of a wafer by spin coating. Ž<P>SOLUTION: A color resist 41R' as a coating material is applied onto a wafer 101 by spin coating while the wafer 101 is kept in a state wherein an annular convex 101a is formed on its outer circumferential part 53 outside the chip area 52 of the wafer 101. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010005572(A) 申请公布日期 2010.01.14
申请号 JP20080169697 申请日期 2008.06.28
申请人 NIKON CORP 发明人 TSURUTA HACHIRO
分类号 B05D1/40 主分类号 B05D1/40
代理机构 代理人
主权项
地址