发明名称 POSITION MEASURING METHOD, AND EXPOSURE METHOD AND DEVICE
摘要 <p>Provided is a position measuring method capable of correcting straightness information relating to a reflection plane used for measuring position information relating to a mobile object in a short time.  The position measuring method for measuring the position of a plate stage (PST) by means of a moving mirror (51Y) comprises a step for acquiring first straightness information relating to the moving mirror (51Y) by repeating the movement of the plate stage (PST) in the X direction and the position measurement of the moving mirror (51Y) in the Y direction a first number of times, a step for acquiring second straightness information relating to the moving mirror (51Y) by repeating the movement of the plate stage (PST) in the X direction and the position measurement of the moving mirror (51Y) in the Y direction a second number of times smaller than the first number of times, and a step for correcting the first straightness information with the second straightness information.</p>
申请公布号 WO2010004900(A1) 申请公布日期 2010.01.14
申请号 WO2009JP61856 申请日期 2009.06.29
申请人 NIKON CORPORATION;KATO MASAKI;OKAWA TOMOYUKI;MIZUHASHI KENSUKE 发明人 KATO MASAKI;OKAWA TOMOYUKI;MIZUHASHI KENSUKE
分类号 H01L21/027;G03F9/00;H01L21/68 主分类号 H01L21/027
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