发明名称 WAFER TREATING METHOD
摘要 A wafer treating method includes the steps of irradiating a wafer, provided with devices on the face side, from the back side with a laser beam capable of being transmitted through the wafer, while converging the laser beam to a predetermined depth, so as to form a denatured layer between the face side and the back side of the wafer, and separating the wafer into a back-side wafer on the back side relative to the denatured layer and a face-side wafer on the face side relative to the denatured layer. The denatured layer remaining in the face-side wafer is removed, and the face-side wafer is finished to a predetermined thickness, whereby the devices constituting the face-side wafer are finished into products, and the back-side wafer is recycled.
申请公布号 US2010009549(A1) 申请公布日期 2010.01.14
申请号 US20090482291 申请日期 2009.06.10
申请人 DISCO CORPORATION 发明人 SEKIYA KAZUMA
分类号 H01L21/00 主分类号 H01L21/00
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