发明名称 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, NOVEL COMPOUND, AND ACID GENERATOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a novel compound useful as an acid generator for a resist composition, an acid generator using the compound, a resist composition containing the acid generator, and a resist pattern forming method using the resist composition. <P>SOLUTION: The resist composition contains a base component (A) of which the solubility in an alkali developer changes by the action of an acid and an acid generator component (B) which generates an acid upon exposure to light, wherein the acid generator component (B) contains an acid generator (B1) comprising a compound represented by a general formula (b1-1) wherein Y<SP>11</SP>is 1-4C fluorinated alkyl; Y<SP>12</SP>is 1-4C fluorinated alkylene; Y<SP>13</SP>is a single bond or a divalent linking group, X<SP>10</SP>is a 3-30C cyclic hydrocarbon group, and A<SP>+</SP>is an organic cation. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010008912(A) 申请公布日期 2010.01.14
申请号 JP20080170812 申请日期 2008.06.30
申请人 TOKYO OHKA KOGYO CO LTD 发明人 ISHIZUKA KEITA;UTSUMI YOSHIYUKI;HANEDA HIDEO;MATSUZAWA KENSUKE
分类号 G03F7/004;C08F220/10;G03F7/039;H01L21/027 主分类号 G03F7/004
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