发明名称 SPIN COATING METHOD, APPARATUS THEREFOR, METHOD OF PRODUCING SOLID IMAGING ELEMENT, AND METHOD OF PRODUCING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To enhance the uniformity of the film thickness in the plane of a wafer by spin coating. Ž<P>SOLUTION: A coating material 201 is applied onto a wafer 200 by spin coating while the wafer 200 is kept in a forcibly warped state wherein its outer circumferential part of the wafer 200 is elevated relative to its center part. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010005573(A) 申请公布日期 2010.01.14
申请号 JP20080169698 申请日期 2008.06.28
申请人 NIKON CORP 发明人 TSURUTA HACHIRO
分类号 B05D1/40;B05C11/08 主分类号 B05D1/40
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