发明名称 |
SEMICONDUCTOR PHYSICAL QUANTITY SENSOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor physical quantity sensor capable of preventing a movable electrode from sticking to a fixed electrode. Ž<P>SOLUTION: A protrusion 13 is formed on a proper position on the surface of the movable electrode by performing two-stage etching of a silicon substrate 2. A facing area between the silicon substrate 2 and an insulating layer 20 can be reduced by this constitution, so that the silicon substrate 2 can be prevented from sticking to the insulating layer 20 when anodically bonding the silicon substrate 2 with the insulating layer 20. A metal film 14 is formed on a position facing to the protrusion 13 on the under surface 20b of the insulating layer 20. The metal film 14 performs a role of buffer between the silicon substrate 2 and the insulating layer 20 by this constitution, thereby the silicon substrate 2 can be reliably prevented from sticking to the insulating layer 20 when anodically bonding the silicon substrate 2 with the insulating layer 20. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010008127(A) |
申请公布日期 |
2010.01.14 |
申请号 |
JP20080165467 |
申请日期 |
2008.06.25 |
申请人 |
PANASONIC ELECTRIC WORKS CO LTD |
发明人 |
MORIGUCHI HIROSUKE;YOSHIDA HITOSHI |
分类号 |
G01P15/125;G01P9/04;H01L29/84 |
主分类号 |
G01P15/125 |
代理机构 |
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地址 |
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