Material testing method for to-be-examined test object, involves performing heat measurement processes of object at different frequencies, and subjecting phase images of one image element to another image element of differential processing

摘要

The method involves creating a phase image of a test object and representing a phase for individual image elements, where the phase describes a time interval measured for a point. The time interval is yielded as a difference of a set of time points of a predetermined temperature of an initial radiator and another set of time points of a measured surface temperature of the test object. Two heat measurement processes of the test object are performed at different excitation frequencies. Phase images of one of the image elements are subjected to another image element of differential processing. An independent claim is also included for a device for material testing by a heat source for heat radiation of a test object, comprising a control device.