发明名称 IMPEDANCE MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an impedance measuring method that reduces the contact resistance with an electronic component to be measured, prevents the occurrence of measuring variations resulting from the contact resistance, and accurately measures impedance. Ž<P>SOLUTION: The impedance measuring method uses an impedance measuring instrument, a coaxial connector 10 electrically connected to the impedance measuring instrument, and a measurement board 20 storable in the coaxial connector 10. The measurement board 20 has an insulating substrate IS1, and first and second conductors 21 and 22 formed on the first main surface IS1a of the insulating substrate IS1. The measurement board 20 mounted with the electronic component 40 to be measured is stored in the coaxial connector 10 connected to the impedance measuring instrument so that the first conductor 21 is electrically connected to a central conductor 11 and the second conductor 22 is electrically connected to an external conductor 12, and the impedance of the electronic component 40 to be measured is measured by the impedance measuring instrument. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010008363(A) 申请公布日期 2010.01.14
申请号 JP20080170941 申请日期 2008.06.30
申请人 TDK CORP 发明人 TOGASHI MASAAKI
分类号 G01R27/02;G01R35/00 主分类号 G01R27/02
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