发明名称 RETICLE AND METHOD FOR FORMING PHOTO RESIST PATTERN USING THE SAME
摘要 <p>PURPOSE: A reticle and a method for forming a photo resist pattern using the same are provided to prevent a bridge between patterns in forming a sensitive film pattern by including light-shield patterns with uniform interval between them. CONSTITUTION: In a reticle and a method for forming a photo resist pattern using the same, a reticle is arranged in a first direction and a second direction. The reticle comprises a plurality of light-shield pattern having the outer circumference on which a first concave surface and a second convex surface are formed alternately. A neighboring light-shield pattern(12) is opposite to the second surface having a protrusion in a first direction. A neighboring light-shield pattern is opposite to the first surface having a protrusion in a second direction.</p>
申请公布号 KR20100004703(A) 申请公布日期 2010.01.13
申请号 KR20080065021 申请日期 2008.07.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, CHUN HEE
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址