发明名称 |
APPARATUSFOR MEASURING LIGHT PROCEEDED TO BACKWARD, WHICH APPLIED PLASMONIC DEVICE |
摘要 |
PURPOSE: An apparatus for measuring a light processing to backward is provided to control the polarization of a light projecting a plasma monic device by installing a polarization modulation unit between a light source and the plasma monic device. CONSTITUTION: A plasma monic device(160) comprises a metallic foil having an opening of a nanometer caliber. The plasma monic device is closely arranged to an object. The plasma monic device generates the proximity in the front of the opening. The polarization modulation unit(110) controls the polarization state of the light passed through the opening of the plasma monic device and modulates the light with proximity field. A measuring unit(170) detects the property of object from the light passed from the polarization modulation unit. The intensity of the proximity filed generated between the object and the plasma monic device is varied according to the property of object.
|
申请公布号 |
KR20100003926(A) |
申请公布日期 |
2010.01.12 |
申请号 |
KR20080063985 |
申请日期 |
2008.07.02 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY |
发明人 |
HAHN, JAE WON |
分类号 |
G02B6/12;G02B27/26 |
主分类号 |
G02B6/12 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|