| 摘要 |
A device for prediction of electron technology products reliability according level of low-frequency noise additionally comprises a multiplexor, a first input of which is connected to output of a root-mean-square detector, a second – to comparator output, a comparator, one of inputs of which is connected to output of a first low-frequency filter with 1kHz frequency cutoff, a second comparator input – to output of a reference voltage former, input of which is connected to output of a first digit-to-analogue convertor, an analogue-to-digit convertor having input connected to multiplexor output, a precision analog-to-digital convertor is used as the analogue-to-digit convertor, output of it – to port 3 of a microcontroller, a second digit-to-analogue convertor is connected to port 5, output of which is connected to input of a second low-frequency filter. |
