发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 PURPOSE: A semiconductor device and a method of fabricating the same are provided to improve the gap fill performance by forming a hybrid structure with the bottom element isolation film and the top element isolation film. CONSTITUTION: In a semiconductor device and a method of fabricating the same, a semiconductor substrate has a trench defining an active area. A first element isolation film(120a) fills the lower part of the trench. A second element isolation film(122a) fills the top of the trench. The first element isolation film comprises TOnen SilaZene. The second element isolation film comprises the high density plasma oxide. The volume ratio of the high density plasma oxide and Tonen Silazane is 3:7 ~ 7:3.
申请公布号 KR20100002717(A) 申请公布日期 2010.01.07
申请号 KR20080062716 申请日期 2008.06.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN, JEONG GUK;SUE, JI WOONG
分类号 H01L21/76 主分类号 H01L21/76
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