| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device and a testing method to be applied to the testing device of an integrated circuit, for example, in which a high-voltage is safely applied when the high-voltage is applied by a separate power supply to a terminal to which a test pattern and the like is applied. SOLUTION: While a DC voltage V1 is lowered, the DC voltage V1 is applied to a pin 7 of a test target 2, and then application of an output signal S1 for operation test is stopped. Thereafter, a DC voltage V11 is raised to a voltage for breakdown test. COPYRIGHT: (C)2010,JPO&INPIT
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