| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problem that a conventional method calculates a detection temperature by adjusting an output with a thermopile type infrared detection device in line with emissivity of a detection object, resulting in a problem that temperature measurement accuracy of the detection object tends to drop as the detection object changes or the emissivity thereof changes, and that a method of calculating the emissivity of the detection object by measuring reflectivity of the detection object with a photointerrupter provided on another substrate, and compensating a detection output from the thermopile type infrared detection device causes a shift to occur in compensation, resulting in a problem of erroneous detection when the emissivity changes due to contamination of either one of the measured areas because different areas are measured. Ž<P>SOLUTION: The present invention is provided with the photointerrupter for calculating the emissivity of the detection object by measuring the reflectivity of the detection object on the same substrate as the thermopile type infrared detection device and enhances the temperature measurement accuracy by detecting the same area as a thermopile detection area. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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