发明名称 INTERNAL STATE DETECTION CIRCUIT OF INTEGRATED CIRCUIT, AND INTEGRATED CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To output an internal state of an integrated circuit by terminals of the integrated circuit, whose number is smaller than that of the internal states. Ž<P>SOLUTION: An internal state detection circuit is provided with a state detector part 12 having a plurality of state detectors detecting a plurality of state detection signals corresponding to the internal states of the integrated circuit, and the circuit is also provided with an integrated circuit internal state voltage generating circuit 13 generating different integrated circuit internal state voltages corresponding to the integrated circuit internal states formed of a combination of a plurality of states outputted from a plurality of the state detectors. The circuit is also provided with an output terminal 43 pulling the integrated circuit internal state voltage to the outside. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010003751(A) 申请公布日期 2010.01.07
申请号 JP20080159340 申请日期 2008.06.18
申请人 SONY CORP 发明人 SHIKAI NOBUHIKO
分类号 H01L21/822;H01L27/04 主分类号 H01L21/822
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