| 摘要 |
<P>PROBLEM TO BE SOLVED: To automatically extract a test pattern for operating a test object near a boundary condition without analyzing the internal structure of the test object. Ž<P>SOLUTION: The present test pattern extraction technique includes: a step of acquiring an identifier of processing performed by an inspected object for a test pattern to store an identifier of the processing in response to the test pattern into a test result data storing section; and a step of computing a distance among the test patterns which are stored in the test result data storing section and in which the identifiers of the processing are different and specifying a couple of the test pattern where the distance concerned fulfills a predetermined conditions for each couple of the identifier of the processing to store into the pattern data storing section. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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