| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor test device capable of determining the switching time of high/low from a plurality of pins at the same timing while preventing determination time from being extended. Ž<P>SOLUTION: The semiconductor test device 1 outputs a signal for a device 50 under test, and determines the quality of the device 50 under test on the basis of respective result signals obtained from the plurality of pins of the device 50 under test. The semiconductor test device 1 determines whether it is a high level or a low level for a prescribed number of times on the basis of a set offset value and resolution, determines the switching time of the result signal between high and low for each of the result signals from the plurality of pins, sets the offset value at the next time for each of the result signals in response to the determined switching time, and sets the resolution at the next time higher than the resolution set by a determination timing setting part. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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