发明名称 Defect Inspection Method and Apparatus
摘要 In a detection step, light produced on a sample in plural directions are collectively detected using a plurality of detectors. Multidimensional features containing information about scattered light distributions are extracted based on a plurality of detector outputs obtained. The feature is compared with data in a scattered light distribution library thereby to determine the types and sizes of defects. In a feature extraction step, a feature outputted based on the magnitude of each of scattered light detected signals of scatterers already known in refractive index and shape, which are obtained in the detection step, is corrected, thereby realizing high precision determination.
申请公布号 US2010004875(A1) 申请公布日期 2010.01.07
申请号 US20090488610 申请日期 2009.06.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 URANO YUTA;HONDA TOSHIFUMI;HAMAMATSU AKIRA;MAEDA SHUNJI
分类号 G01N21/88;G01N21/956;G06F19/00;H01L21/66 主分类号 G01N21/88
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