发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device, which is able to improve on-current and mobility of a polycrystal TFT without disturbing a high integration level; and to provide a semiconductor device obtained by the same. SOLUTION: The manufacturing method comprises steps of: adding a catalytic element to a semiconductor film and heating the semiconductor film to form a more crystallized first region; forming a less crystallized second region than the first region; irradiating the first region with the first laser light to form a more crystallized third region than the first region; irradiating the second region with second laser light to form a more crystallized fourth region than the second region; and patterning the third region to form a first island-shaped region and the fourth region to form a second island-shaped region, wherein the first laser light has the same energy density from the second laser light, and a scan speed of the first laser light is faster than that of the second laser light. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010004057(A) 申请公布日期 2010.01.07
申请号 JP20090184098 申请日期 2009.08.07
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MORIWAKA YOSHIE
分类号 H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L21/20
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