发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes a MOSFET having: a gate electrode provided over a silicon substrate; and a first impurity diffusion region and a second impurity diffusion region provided in the silicon substrate in different sides of said first gate electrode, wherein the MOSFET has an extension region in an upper section of the first impurity diffusion region and no extension region in an upper section of the second impurity diffusion region, and has a first silicide layer over the first impurity diffusion region and has no silicide layer over the second impurity diffusion region in vicinity of a side edge of the gate electrode.
申请公布号 US2010001352(A1) 申请公布日期 2010.01.07
申请号 US20090458196 申请日期 2009.07.02
申请人 NEC ELECTRONICS CORPORATION 发明人 TSUTSUI GEN;FUKASE TADASHI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
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