| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an analysis method capable of analyzing simultaneously element components in a liquid sample aiming at many elements by simple operation in comparison with an ICP (Inductively Coupled Plasma) analysis method which is performed usually as an analysis method for element components in the liquid sample, and capable of analyzing even a chemical state such as a valence or the like of the detected element component. Ž<P>SOLUTION: In this analysis method, the liquid sample is dropped onto a clean base material surface, and surface analysis of the base material surface after being dried is performed. As a surface analysis method, an XPS (X-ray Photoelectron Spectroscopy) analysis method or the like is enumerated, and when being used together with an ICP-AES (Inductively Coupled Plasma-Atomic Emission Spectroscopy) analysis, a result which is unmeasurable in the ICP-AES analysis can be supplemented. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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