| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester to correctly transmit serial data between IC chips. SOLUTION: An IC tester for testing objects to be tested is improved in the present invention. The tester includes: a first IC chip outputting an initiation signal to transmit serial data and transmitting serial data after a predetermined time from the initiation signal; and a second IC chip receiving the serial data after receiving the initiation signal of the first IC chip. COPYRIGHT: (C)2010,JPO&INPIT
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