TEST CIRCUIT, INTEGRATED CIRCUIT, EXTERNAL TESTER, MEASUREMENT METHOD OF SETUP TIME, CONTROL PROGRAM, AND READABLE STORAGE MEDIUM

摘要

<P>PROBLEM TO BE SOLVED: To accurately implement a timing test of read data from a data source only a small number of times, and reduce an increase in a cost of the timing test. Ž<P>SOLUTION: A test circuit comprises: a supply clock generated from an external clock; a correction clock as the supply clock signal delayed by a delay means 5; a first multiplexer 6 for inputting a read clock from the outside, and selectively outputting it to the data source; and a second multiplexer 7 for inputting the correction clock signal output from the delay means 5 and the read clock, and selectively outputting them to a clock terminal of a flip-flop 4. The first and second multiplexers 6, 7 are controlled by at least one test input signal. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž