发明名称 EQUIPMENT FOR CHEMICAL MECHANICAL POLISHING
摘要 PURPOSE: Chemical mechanical polishing equipment is provided to prevent generation of a scratch by forming particle balls within a polyurethane matrix. CONSTITUTION: Chemical mechanical polishing equipment comprises a polishing head, a platen, a slurry supply part, and a polishing pad(800). The polishing head rotates the top part of a wafer. The platen is rotated on the bottom part of the wafer corresponding with the polishing head. The slurry supply part supplies slurry to the platen or the wafer rotated on the top part of the platen. Particle balls(810) are randomly formed on the polishing pad. The surface area contacted with the wafer is uniformly maintained within a matrix(830).
申请公布号 KR20100001560(A) 申请公布日期 2010.01.06
申请号 KR20080061514 申请日期 2008.06.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, MYUNG KI;YOON, BO UN;KOH, YOUNG HO;LEE, JONG WON;CHOI, JAE KWANG;HONG, CHANG KI
分类号 B24B37/04;B24B37/10;B24B37/24;H01L21/304 主分类号 B24B37/04
代理机构 代理人
主权项
地址