发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device is provided to prevent electric short by connecting a gate conductive part formed on a pin pattern to a landing plug. CONSTITUTION: An active area, a device isolation area, and a gate area are defined on a semiconductor substrate(100). A mask pattern exposing the gate area is formed on the semiconductor substrate. A recessed groove is formed on the active region by etching the exposed active area and device isolation area. An ion implantation area(110a,110) is formed on the oxide layer comprising the device isolation area and the lower side of the recessed groove by performing an ion implantation process. The pin pattern is formed on the semiconductor substrate by an etching process. The mask pattern is removed after the ion implantation process.</p>
申请公布号 KR20100001868(A) 申请公布日期 2010.01.06
申请号 KR20080061946 申请日期 2008.06.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HAN, BYOUNG HEE
分类号 H01L29/78;H01L21/265;H01L21/336 主分类号 H01L29/78
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