发明名称 AN IMAGE INSPECTION APPARATUS AND INSPECTION METHOD THEREOF
摘要 PURPOSE: An image inspection apparatus and an inspection method thereof are provided to inspect defects rapidly regardless of the skill of an operator or the illuminance. CONSTITUTION: A lighting part(100) examines the light in an inspected camera module(200). A filter(110) has a reticulated type slit in which the light passes through. An image display is connected to an image output terminal of the inspected camera module. The light passing through the filter enters a lens array(210) of the camera module. The light is transformed with an image sensor(220) to an electric signal. The radius of the slit is 0.05 mm to 0.90 mm.
申请公布号 KR20100001688(A) 申请公布日期 2010.01.06
申请号 KR20080061699 申请日期 2008.06.27
申请人 UNISEM CO., LTD. 发明人 SEON, DO JIN
分类号 G01M11/00;G01M11/02 主分类号 G01M11/00
代理机构 代理人
主权项
地址