发明名称 System and method for predicting system events and deterioration
摘要 <p>A method of predicting deterioration in a mechanical device includes the steps of providing a health model for the mechanical device, the health model including a plurality of health states for modeling the mechanical device, receiving device data for the mechanical device, estimating values for the plurality of health states, based on the device data, predicting one or more events based on the health model and the device data, each of the one or more events affecting one or more of the plurality of health states, and generating a prediction of deterioration in the mechanical device from the estimated values for the plurality of health states and the one or more predicted events.</p>
申请公布号 EP2141560(A2) 申请公布日期 2010.01.06
申请号 EP20090163683 申请日期 2009.06.24
申请人 HONEYWELL INTERNATIONAL INC. 发明人 SHETTY, PRADEEP;MYLARASWAMY, DINKAR;EKAMBARAM, THIRUMARAN
分类号 G05B17/02;G05B19/4065;G05B23/02 主分类号 G05B17/02
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