发明名称 |
Semiconductor IC incorporating a co-debugging function and test system |
摘要 |
A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.
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申请公布号 |
US7644310(B2) |
申请公布日期 |
2010.01.05 |
申请号 |
US20080193945 |
申请日期 |
2008.08.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG SHIN-CHAN;KIM SUN-KYU |
分类号 |
G01R31/28;G06F11/00;G06F11/267;G11C29/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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