发明名称 |
Circuit and method of outputting temperature data of semiconductor memory apparatus |
摘要 |
A circuit for outputting temperature data of a semiconductor memory apparatus includes a temperature detecting circuit that generates a temperature voltage corresponding to a change in temperature and outputs the temperature voltage, an A/D converter that converts the temperature voltage into a first temperature code and outputs it, and a temperature data correcting unit that outputs a second temperature code obtained by correcting an error of the first temperature code using a correction code.
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申请公布号 |
US7643889(B2) |
申请公布日期 |
2010.01.05 |
申请号 |
US20070819423 |
申请日期 |
2007.06.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEONG CHUN-SEOK;LEE KANG-SEOL |
分类号 |
G05B15/00;G05B11/01;G05D23/00 |
主分类号 |
G05B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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