发明名称 Circuit and method of outputting temperature data of semiconductor memory apparatus
摘要 A circuit for outputting temperature data of a semiconductor memory apparatus includes a temperature detecting circuit that generates a temperature voltage corresponding to a change in temperature and outputs the temperature voltage, an A/D converter that converts the temperature voltage into a first temperature code and outputs it, and a temperature data correcting unit that outputs a second temperature code obtained by correcting an error of the first temperature code using a correction code.
申请公布号 US7643889(B2) 申请公布日期 2010.01.05
申请号 US20070819423 申请日期 2007.06.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG CHUN-SEOK;LEE KANG-SEOL
分类号 G05B15/00;G05B11/01;G05D23/00 主分类号 G05B15/00
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