发明名称 Semiconductor apparatus
摘要 It is an object of the present invention to provide a semiconductor apparatus for solving a trade-off between the area, power consumption, noise and accuracy of correction of a variation correction circuit that corrects variations in resistance and threshold voltage, etc. The present invention comprises a multi-value voltage generation circuit shared by a plurality of reading circuits, a multi-value voltage bus that supplies multi-value voltages to the reading circuits and switches that select a voltage suited to variation correction from multi-value voltages, wherein the multi-value voltages are distributed from the multi-value voltage generation circuit to the plurality of reading circuits, the switches select an optimum voltage for correction in the respective reading circuits to thereby correct variations in the elements.
申请公布号 US7642620(B2) 申请公布日期 2010.01.05
申请号 US20030459524 申请日期 2003.06.12
申请人 NEC CORPORATION 发明人 TANAKA AKIO
分类号 G01J1/44;H01L27/00;G01J1/02;G01J5/24;G11C11/15;G11C27/02;H01L21/822;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/14;H01L31/14;H04N5/33 主分类号 G01J1/44
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