发明名称 |
Circuit testing apparatus for testing a device under test |
摘要 |
A circuit testing apparatus for testing a device under test is disclosed. The circuit testing apparatus includes a function generator, a signal measuring module and a determining module. The function generator is coupled to the device under test for providing a plurality of testing signals according to a predetermined manner. The signal measuring module is coupled to the device under test and the function module for measuring a plurality of measuring signals generated by the device under test according to the plurality of testing signals and generating a plurality of measuring results according to the predetermined manner. The determining module is coupled to the signal measuring module for determining a testing result for the device under test according to the plurality of measuring results.
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申请公布号 |
US7642801(B2) |
申请公布日期 |
2010.01.05 |
申请号 |
US20070898317 |
申请日期 |
2007.09.11 |
申请人 |
PRINCETON TECHNOLOGY CORPORATION |
发明人 |
TENG CHENG-YUNG;CHEN HUNG-WEI |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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