发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A nonvolatile memory device and a manufacturing method thereof are provided to reduce a process failure by forming a high voltage gate insulation film and a low voltage insulation film with different thickness. CONSTITUTION: A substrate(101) includes a memory cell part, a low voltage part, and a high voltage part. A tunnel insulation film(105a) is formed in the memory cell part. The tunnel insulation film includes a deposition film. A low voltage gate insulation film(105b) is formed in the low voltage part. A low voltage gate insulation film is made of the same material as the tunnel insulation film. A high voltage gate insulation film(105c) is formed in the high voltage part. The high voltage gate insulation film includes a first oxide film and a low voltage insulation film. The high voltage gate insulation film is thicker than the low voltage gate insulation film.</p>
申请公布号 KR20090132886(A) 申请公布日期 2009.12.31
申请号 KR20080059077 申请日期 2008.06.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JIN TAEK;PARK, YOUNG WOO;CHOI, JUNG DAL;YOU, JANG HYUN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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