发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A P type drift layer is formed in an N type epitaxial layer from under a drain layer to under an N type body layer under a source layer through under an element isolation insulation film. This P type drift layer is shallower immediately under the drain layer than under the element isolation insulation film, and gradually shallows from under the element isolation insulation film to the N type body layer to be in contact with the bottom of the N type body layer. Since the P type drift layer is thus diffused in a wide region, a wide current path is formed from the N type body layer to the drain layer, and the current drive ability is enhanced and the drain breakdown voltage is also increased.
申请公布号 US2009321852(A1) 申请公布日期 2009.12.31
申请号 US20090486062 申请日期 2009.06.17
申请人 SANYO ELECTRIC CO., LTD. 发明人 YONEDA HARUKI;SASADA KAZUHIRO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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