| 摘要 |
A parallel resistor circuit that can reduce an error of a resistance value, an on-die termination having the same, and a semiconductor device having the on-die termination device. The semiconductor memory device includes a calibration circuit configured to pull up or pull down a predetermined node and compare a voltage of the predetermined node with a reference voltage to generate calibration codes, by using parallel resistor units that are turned on or off in response to the calibration codes. An output driver is configured to terminate a data output node to a pull-up or pull-down level to output data, by using the parallel resistor units. At least one of the parallel resistor units having at least two resistivities includes resistors with different resistivities connected to each other in parallel.
|
