发明名称 OPTICAL SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 An optical system, such as an illumination device or a projection objective of a microlithographic projection exposure apparatus, is disclosed. The optical system can include a polarization compensator which has at least one polarization-modifying partial element. The optical system can also include a manipulator by which the position of the at least one partial element can be altered. At least one operating mode of the optical system can be set in which the intensity, over a region which belongs to a plane perpendicular to the optical axis and which can be illuminated with light from the light source, does not exceed 20% of the maximum intensity in the plane, and the manipulator is arranged in the region.
申请公布号 US2009323042(A1) 申请公布日期 2009.12.31
申请号 US20090498475 申请日期 2009.07.07
申请人 CARL ZEISS SMT AG 发明人 TOTZECK MICHAEL;GRUNER TORALF;FIOLKA DAMIAN
分类号 G03F7/20;G02B27/28;G03B27/72 主分类号 G03F7/20
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