发明名称 Sample analyzer, particle distribution diagram displaying method and computer program product
摘要 The present invention is to present a sample analyzer, comprising: a measuring section for obtaining characteristic parameter information regarding particles in a sample by measuring the sample; a particle distribution diagram generator for generating a particle distribution diagram representing distribution state of the particles in the sample regarding the characteristic parameter information, based on the characteristic parameter information obtained by the measuring section; a display; and a display controller for controlling the display so as to display explanation information explaining the distribution state in the particle distribution diagram and the particle distribution diagram.
申请公布号 US2009323062(A1) 申请公布日期 2009.12.31
申请号 US20090459094 申请日期 2009.06.25
申请人 SYSMEX CORPORATION 发明人 ARIYOSHI SHUNSUKE;MIZUMOTO TORU;TATSUTANI HIROO
分类号 G01N21/49;G01N15/14;G06F19/00 主分类号 G01N21/49
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