发明名称 CHARGED PARTICLE BEAM APPARATUS
摘要 A charged particle beam impinging on a specimen is set to have left and right tilt angles corresponding to a parallactic angle. A control unit is provided which scans the beam over the specimen while giving a left tilt and a right tilt corresponding to the parallactic angle alternately to the beam on each scanning line. In this way, images are acquired. A three-dimensional image in which deterioration of the resolution is suppressed is displayed in real time by combining aberration cancellation means with the control of the beam according to the parallactic angle. The aberration cancellation means uses an optical system having plural stages of lenses to provide overall cancellation of aberrations by making use of the action of a lens to deflect the beam back to the optical axis.
申请公布号 US2009322973(A1) 申请公布日期 2009.12.31
申请号 US20090490775 申请日期 2009.06.24
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 ITO SUKEHIRO;KATANE JUNICHI;KAWAMATA SHIGERU;TOMITA SHINICHI
分类号 G02F1/1335;G01K1/08;G02B27/22 主分类号 G02F1/1335
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