PURPOSE: A semiconductor device and a semiconductor substrate are provided to suppress BTBT(Band-To-Band Tunneling) by increasing the distance between first and second impurity-doped regions. CONSTITUTION: A gate pattern(330) is formed on a semiconductor substrate(310). A body region(370) is located on the gate pattern. First and second impurity-doped regions(340,350) are positioned on the body region. A cutoff insulation region(380) is positioned between the first and second impurity-doped regions. A BOX(Buried Oxide) insulation region(315) is positioned between the semiconductor substrate and the gate pattern. A gate insulation region(360) is positioned between the gate pattern and the body region.
申请公布号
KR20090132872(A)
申请公布日期
2009.12.31
申请号
KR20080059057
申请日期
2008.06.23
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHA, DAE KIL;KIM, WON JOO;LEE, TAE HEE;PARK, YOON DONG