| 发明名称 |
APPARATUSES AND METHODS TO ENHANCE PASSIVATION AND ILD RELIABILITY |
| 摘要 |
Some embodiments of the present invention include apparatuses and methods relating to processing and packaging microelectronic devices that reduce stresses on and limit or eliminate crack propagation in the devices.
|
| 申请公布号 |
US2009325347(A1) |
申请公布日期 |
2009.12.31 |
| 申请号 |
US20090554523 |
申请日期 |
2009.09.04 |
| 申请人 |
HARRIES RICHARD J;RANGARAJ SUDARASHAN V;SANKMAN BOB |
发明人 |
HARRIES RICHARD J.;RANGARAJ SUDARASHAN V.;SANKMAN BOB |
| 分类号 |
H01L21/56 |
主分类号 |
H01L21/56 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
