发明名称 |
Temperature measurement with reduced extraneous infrared in a processing chamber |
摘要 |
Temperature measurement using a pyrometer in a processing chamber is described. The extraneous light received by the pyrometer is reduced. In one example, a photodetector is used to measure the intensity of light within the processing chamber at a defined wavelength. A temperature circuit is used to convert the measured light intensity to a temperature signal, and a doped optical window between a heat source and a workpiece inside processing chamber is used to absorb light at the defined wavelength directed at the workpiece from the heat source.
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申请公布号 |
US2009323759(A1) |
申请公布日期 |
2009.12.31 |
申请号 |
US20080217063 |
申请日期 |
2008.06.30 |
申请人 |
GOVINDARAJU SRIDHAR;KNUTSON KARSON;KENNEL HAROLD;KILLAMPALLI ARAVIND;HWANG JACK |
发明人 |
GOVINDARAJU SRIDHAR;KNUTSON KARSON;KENNEL HAROLD;KILLAMPALLI ARAVIND;HWANG JACK |
分类号 |
G01J5/06;H05B6/00 |
主分类号 |
G01J5/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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