PROCESS OF ACCURATE MEASURING OF AMPLITUDE AND PHASE DEPENDENCY OF A MAJOR NUMBER OF HIGH-FREQUENCY SIGNALS AND DEVICE FOR THE IMPLEMENTATION OF THE PROCESS

摘要

The submitted invention refers to a process of accurate measuring of amplitude and phase dependency of a major number of high- frequency signals, which is particularly applied in synchrotron acceleration of elementary particles. The main feature of the submitted solution is in the fact that by a single measurement device a 0.2 micron resolution and a 1 micron repeatability of the measurement are obtained up to the lower frequency limit of few kHz and this without overlapping distortion. Simultaneously, at the resolution lower by one level it is possible to monitor phenomena in the frequency range of up to several MHz. The process according to the invention includes an alternating control with the help of a radio-frequency (RF) switch by each of the sets of analogue input signals per each of the series of RF processing units; the attenuation of the aforementioned analogue input signals in RF processing units with the purpose of adapting signals to the measurement reach of the series of analogue-digital converters; controlling the attenuated input signals into a series of analogue-digital (A/D) converters and the conversion of analogue into digital signals; conducting digital signals into a digital attenuation corrector; adjusting digital signals by using correction signals from reverse model assessed system errors; acquiring of digital signals originating from a digital corrector in a digital switch and sending organised, recombined groups of digital signals into a series of digital receivers; and filtering the recombined group of digital signals in a set of low-band filters.