发明名称 PLASMA ELECTRON TEMPERATURE MEASURING METHOD AND DEVICE
摘要 A laser beam with a wavelength capable of exciting atoms of helium in the metastable state is directed to a generated plasma, and atoms in the metastable state are excited. Absorption amount information representing the amount of laser beam absorbed is acquired, and the density of atoms of helium in the metastable state in the plasma is computed from the absorption amount. The emissions of light from helium gas in the plasma caused by transition from two different excited states to the lower level are measured, and the ratio between the intensities of the emissions is determined. The electron temperature of the produced plasma is computed from the computed density of the atoms of helium gas in the metastable state and the computed emission intensity ratio. With this, the plasma electron temperature can be computed with a relatively high accuracy irrespective of the condition of the plasma atmosphere.
申请公布号 EP2139300(A1) 申请公布日期 2009.12.30
申请号 EP20080738754 申请日期 2008.03.24
申请人 MITSUI ENGINEERING & SHIPBUILDING CO., LTD. 发明人 TAKIZAWA, KAZUKI
分类号 H05H1/00;H01J37/32;H01L21/205;H01L21/3065 主分类号 H05H1/00
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